Investigation of hygrothermally induced failures in multilayer ceramic
The reliability issues of hygrothermally induced defects during thermal reflow of multilayer ceramic capacitor was investigated to determine the root causes and propagation mechanism of the defects. Samples of the capacitor package were subjected to JEDEC preconditioning Level 1 (85 °C/85 %RH/168 h) with 5 times thermal reflow at 270 °C.
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